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Dr. Uzma Batool
Assistant Professor
Contact Information
  [email protected]
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Education Detail
PhD (Computer Science) --

U. Batool, M. I. Shapiai, S. A. Mostafa and M. Z. Ibrahim, "An Attention-Augmented Convolutional Neural Network With Focal Loss for Mixed-Type Wafer Defect Classification," IEEE Access, vol. 11, pp. 108891-108905, 2023, doi: 10.1109/ACCESS.2023.3321025. [ISSN: 2169-3536, Clarivate Analytics, Elsevier, ProQuest, Impact factor 3.476, IEEE] U. Batool, M. I. Shapiai, M. Tahir, Z. H. Ismail, N. J. Zakaria and A. Elfakharany, "A Systematic Review of Deep Learning for Silicon Wafer Defect Recognition," IEEE Access, vol. 9, pp. 116572-116593, 2021, doi: 10.1109/ACCESS.2021.3106171. [ISSN: 2169-3536, Clarivate Analytics, Elsevier, ProQuest, Impact factor 3.476, IEEE] N. A. Abd Hamid, M. I. Shapiai, U. Batool, R. S. Sarban Singh, M. K. Mohammed Amin, and K. A. Elias, "Incorporating attention mechanism in enhancing classification of alzheimer’s disease," New Trends in Intelligent Software Methodologies, Tools and Techniques, Frontiers in Artificial Intelligence and Applications. IOS Press, pp. 496-509, 2021. [ISSN: 0922-6389 , ACM Digital Library, Web of Science, Scopus, SJR 0.252, IOS Press] F. ALAM, M. I. SHAPIAI, U. BATOOL, A. K. RAMLI and K. A. ELIAS, “Skeleton-Based Action Recognition with Joint Coordinates as Feature Using Neural Oblivious Decision Ensembles,” New Trends in Intelligent Software Methodologies, Tools and Techniques, Frontiers in Artificial Intelligence and Applications. IOS Press, pp. 380-392, 2021. [ISSN: 0922-6389 , ACM Digital Library, Web of Science, Scopus, SJR 0.252, IOS Press]U. Batool, M. I. Shapiai, N. Ismail, H. Fauzi, and S. Salleh, "Oversampling based on data augmentation in convolutional neural network for silicon wafer defect classification." Knowledge Innovation Through Intelligent Software Methodologies, Tools and Techniques, Frontiers in Artificial Intelligence and Applications. IOS Press, 2020. 3-12. [ISSN: 0922-6389 , ACM Digital Library, Web of Science, Scopus, SJR 0.252, IOS Press] U. Batool, M. I. Shapiai, H. Fauzi and J. X. Fong, "Convolutional Neural Network for Imbalanced Data Classification of Silicon Wafer Defects," 2020 16th IEEE International Colloquium on Signal Processing & Its Applications (CSPA), Langkawi, Malaysia, 2020, pp. 230-235, doi: 10.1109/CSPA48992.2020.9068669. J. X. Fong, M. I. Shapiai, Y. Y. Tiew, U. Batool and H. Fauzi, "Bypassing MRI Pre-processing in Alzheimer's Disease Diagnosis using Deep Learning Detection Network," 2020 16th IEEE International Colloquium on Signal Processing & Its Applications (CSPA), Langkawi, Malaysia, 2020, pp. 219-224, doi: 10.1109/CSPA48992.2020.9068680. U. Batool, and M. I. Shapiai, “Imbalanced Data Resampling In Convolutional Neural Network For Wafer Map Defect Classification,” Industry 4.0 Regional Conference 2020 (i4RC2020), Universiti Teknologi Malaysia. H. Fauzi, and U. Batool, "A three-bar truss design using single-solution simulated Kalman filter optimizer," Mekatronika: Journal of Intelligent Manufacturing and Mechatronics, vol.1, number 2, pp 98-102, 2019. A. M. Abdullah, U. Batool, and H. Fauzi, “Design of an Helical Spring using Single-solution Simulated Kalman Filter Optimizer,” Mekatronika: Journal of Intelligent Manufacturing and Mechatronics, vol.1, number 2, pp 93-97, 2019.

Research Interest
Visual Computing,
Deep Learning,
Pattern Recognition